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Applied Physics Letters : Probing antiphase boundaries in Fe3O4 thin films using micro-Raman spectroscopy

By Shailja Tiwari, D. M. Phase, and R. J. Choudhary

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Book Id: WPLBN0002169271
Format Type: PDF eBook :
File Size: Serial Publication
Reproduction Date: 12 December 2008

Title: Applied Physics Letters : Probing antiphase boundaries in Fe3O4 thin films using micro-Raman spectroscopy  
Author: Shailja Tiwari, D. M. Phase, and R. J. Choudhary
Volume: Issue : December 2008
Language: English
Subject: Science, Physics, Natural Science
Collections: Periodicals: Journal and Magazine Collection (Contemporary), Applied Physics Letters Collection
Historic
Publication Date:
Publisher: American Institute of Physics

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D. M. Phase, And R. J. Choudhar, S. T. (n.d.). Applied Physics Letters : Probing antiphase boundaries in Fe3O4 thin films using micro-Raman spectroscopy. Retrieved from http://community.worldlibrary.net/


Description
Description: We present Raman study of Fe3O4 films of different thicknesses grown on single crystal Si and MgO substrates to investigate the presence of antiphase boundaries (APBs). X-ray diffraction and x-ray photoelectron spectroscopy measurements indicate that films are single phase Fe3O4 on both the substrates. The changes in frequency and linewidth of different Raman modes [A1g and T2g(3)] are monitored and the electron-phonon coupling parameter (λ) is computed. λ is correlated with the combined effect of strain and APBs present in the grown films and it is concluded that the films grown on Si substrates are free from APBs.

 

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